Frequency-dependent failure mechanisms of nanocrystalline gold interconnect lines under general alternating current
Frequency-dependent failure mechanisms of nanocrystalline gold interconnect lines under general alternating current
Publisher
Journal of Applied Physics
Date Issued
2014
Program
面上项目
Project ID
51171045
Sponsorship
金属薄膜热疲劳损伤行为及其微观机制的研究
Institution
东北大学
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http://or.nsfc.gov.cn/handle/00001903-5/281806
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