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JointInference: a Statistical Approach for Open Information Extraction
Publisher: APPLIED MATHEMATICS & INFORMATION SCIENCES
2012
34
A New IC Solder Joint Inspection Method for anAutomatic Optical Inspection System Basedon an Improved Visual BackgroundExtraction Algorithm
Publisher: IEEE Transactions on Components, Packaging and Manufacturing Technology. Part C. Manufacturing
null
59
Adaptive phase denoising based on first order local polynomial analysis
Publisher: International Journal for Light and Electron Optics
2015
44
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