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创新研究群体项目 X 中国科学院计算技术研究所 X

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Test-Quality Optimization for Variable n-Detections of Transition Faults
Publisher: IEEE Transactions on Very Large Scale Integration Systems (TVLSI)
2014
49
Economizing TSV resources in 3D Network-on-Chip design
Publisher: IEEE Transactions on Very Large Scaled Integration Systems (TVLSI)
2015
50
RISO: Enforce Noninterfered Performance With Relaxed Network-on-Chip Isolation in
Publisher: IEEE Transactions on Very Large Scale Integration Systems (TVLSI)
2015
58
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